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Department of Computer Science

Plublications of Christian Hakert

2022

2021

  • Software-Managed Read and Write Wear-Leveling for Non-Volatile Main Memory.
    Christian Hakert, Kuan-Hsun Chen, Horst Schirmeier, Lars Bauer, Paul R. Genssler, Georg von der Brüggen, Hussam Amrouch, Joerg Henkel and Jian-Jia Chen.
    ACM Transactions on Embedded Computing Systems
    2021
  • OCTO+: Optimized Checkpointing of B+Trees for Non-Volatile Main Memory Wear-Leveling.
    Christian Hakert, Roland Kühn, Kuan-Hsun Chen, Jian-Jia Chen and Jens Teubner.
    In The 10th IEEE Non-Volatile Memory Systems and Applications Symposium (NVMSA)
    2021
  • HEART: Hybrid memory and Energy-Aware Real-Time scheduling for multi-processor systems.
    Mario Guenzel, Christian Hakert, Kuan-Hsun Chen and Jian-Jia Chen.
    In 21th International Conference on Embedded Software, {EMSOFT}
    2021
  • BLOwing Trees to the Ground: Layout Optimization of Decision Trees on Racetrack Memory.
    Christian Hakert, Asif-Ali Khan, Kuan-Hsun Chen, Fazal, Jeronimo Castrillon and Jian-Jia Chen.
    In 58th ACM/IEEE Design Automation Conference (DAC), accepted
    2021
  • Future Computing Platform Design: A Cross-Layer Design Approach.
    Hsiang-Yun Cheng, Chun-Feng Wu, Christian Hakert, Kuan-Hsun Chen, Yuan-Hao Chang, Jian-Jia Chen, Chia-Lin Yang and Tei-Wei Kuo.
    In Design, Automation and Test in Europe Conference (DATE)
    2021
  • Tutorial for Full System Simulations of Non-Volatile Main Memories.
    Jian-Jia Chen and Christian Hakert.
    In Design, Automation and Test in Europe Conference
    2021
  • [Demo] Tutorial for Full System Simulations of Non-Volatile Main Memories.
    Christian Hakert and Jian-Jia Chen.
    In Design, Automation and Test in Europe Conference
    2021
  • Margin-Maximization in Binarized Neural Networks for Optimizing Bit Error Tolerance.
    Sebastian Buschjäger, Jian-Jia Chen, Kuan-Hsun Chen, Mario Günzel, Christian Hakert, Katharina Morik, Rodion Novkin, Lukas Pfahler and Mikail Yayla.
    In Design, Automation and Test in Europe Conference (DATE), accepted
    2021, Best Paper Award Candidate

2020

2019